Semiconductor failure analysis systems to locate, visualize and analyze failures inside semiconductor devices by detecting weak light emissions, heat emissions or electrical changes by induced light beam.

3 items found

thermal f1 product photo

Thermal F1 Emission microscope: C14229-01   NEW

  • Thermal analysis

The “Thermal F1” is the next generation in thermal emission microscopy.

iphemos-mp product photo

iPHEMOS-MP Inverted emission microscope: C10506-04-16

  • Multiple detector
  • High NA macro lens

Inverted emission microscope for analyzing semiconductor wafers from the backside. It incorporates specially designed high NA macro lens for emission analysis.

phemos-1000 product photo

PHEMOS-1000 Emission microscope: C11222-16

  • IR laser confocal microscope
  • High resolution CCD

High resolution emission microscope with IR laser confocal microscope. It can be customized upon request.

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