Effectiveness of PL measurement method | Micro LED PL inspection system

Validation of the PL measurement method

Correlation with EL measurement method

Conventional EL measurement method is the electrical method established as a common inspection method for LEDs. In contrast, PL measurement method detects defects from luminescence emission that occurs when LEDs are excited by photon light. This new method is very effective and advantageous for micro LEDs which have huge number of LEDs chips per wafer. Hamamatsu Photonics has benchmarked in detail those two EL and PL methods, for the specific micro LEDs inspection. In conclusion, we confirm that we could access the same results with both methods.

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