Semiconductor failure analysis systems to locate, visualize and analyze failures inside semiconductor devices by detecting weak light emissions, heat emissions or electrical changes by induced light beam.

5 items found

iphemos-mp product photo

iPHEMOS-MP Inverted emission microscope: C10506-04-16

  • Multiple detector
  • High NA macro lens

Inverted emission microscope for analyzing semiconductor wafers from the backside. It incorporates specially designed high NA macro lens for emission analysis.

themos-mini product photo

THEMOS mini Thermal emission microscope: C10614-02

  • Entry model
  • High resolution thermal camera

Thermal emission microscope to detect and localize thermal signal generated by failures such as short circuits. Its compact design and simple operation are good for entry-level of thermal emission analysis.

phemos-1000 product photo

PHEMOS-1000 Emission microscope: C11222-16

  • IR laser confocal microscope
  • High resolution CCD

High resolution emission microscope with IR laser confocal microscope. It can be customized upon request.

u10024-11 product photo

FA-Navigation Semiconductor failure analysis support system: U10024-11

  • In-line version

FA-Navigation software uses CAD data to effectively narrow down failure locations and reduces turnaround time for failure analysis. This software links with other semiconductor failure analysis systems.

u10024-51 product photo

FA-Navigation Semiconductor failure analysis support system: U10024-51

  • Standalone version

FA-Navigation software uses CAD data to effectively narrow down failure locations and reduces turnaround time for failure analysis. This software is standalone and does not link other semiconductor failure analysis systems.

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