Semiconductor failure analysis systems for verification of list design and its operation and locating and analyzing a transistor causing a failure by analyzing operation time of LSI.

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triphemos product photo

TriPHEMOS Time-resolved imaging emission microscope

  • Time resolved detector
  • Tester direct docking

Time-resolved emission microscope with a 2D high sensitivity detector to capture picosecond level of operation timing at multiple points inside of an LSI.

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