Semiconductor failure analysis systems to detect and locate thermal signal generated by failures such as short circuit, abnormality of contact holes, microplasma leakage in oxide layer and oxide layer breakdown.

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themos-mini product photo

THEMOS mini Thermal emission microscope: C10614-02

  • Entry model
  • High resolution thermal camera

Thermal emission microscope to detect and localize thermal signal generated by failures such as short circuits. Its compact design and simple operation are good for entry-level of thermal emission analysis.

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