10/24/2006

The LF1 series provides high-intensity and large-area flash exposure for cameras used in semiconductor inspection and other applications.

Hamamatsu, Japan – October 24, 2006 – Hamamatsu Photonics is offering sample units of its new LF1 series of flash light sources to both Japan-based and international manufacturers of semiconductor inspection systems and FA (factory automation) systems. The LF1 series provides flash exposure for cameras used in semiconductor inspection and other inspection applications. It can serve as a replacement for halogen lamps or continuous mode xenon lamps, and is expected to aid in the development of new inspection methods. In terms of operation, the LF1 series delivers high-intensity light pulses through an optical fiber (maximum energy per flash: 1.28 joules). Large-area exposure is possible.

The LF1 series will be available in two models: the L10211 (light guide port in rear) and L10212 (light guide port in front). Samples will be available from October 25, 2006. Production release is currently scheduled to begin on January 15, 2007.