Hamamatsu releases the world’s first two-sided film thickness measurement system

2013/09/24

Hamamatsu, Japan – September 24, 2013 – Hamamatsu Photonics K.K. has announced the release of the world’s first two-sided film thickness measurement system. Called the Optical NanoGauge C12562, it will be available to manufacturers from October 10, 2013. The new system will benefit makers of equipment for manufacturing or inspecting products such as film, thin films, flat panel displays, and semiconductor coating.

 

From October 2 to 4, the new Optical NanoGauge will be exhibited at FilmTech Osaka, a part of the Highly-Functional Material World Osaka 2013 trade show to be held at the INTEX Osaka convention center. From November 7 to 9, the system will also be on display at Photon Fair 2013, a company exhibition of new technology that Hamamatsu Photonics will be hosting at the Act City Hamamatsu convention center in Hamamatsu, Japan.

 

Optical NanoGauge「C12562」

Optical NanoGauge C12562

 

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