Evaluation systems for fluorescence/luminescence material and device parameters.

Quantaurus-QY Plus UV-NIR absolute PL quantum yield spectrometer

UV-NIR Abolute PL quantum yields measurement system Quantaurus-QY Plus

Compact one-box absolute quantum yield spectrometer for luminescence materials using photoluminescence method. Additional options allow high-sensitivity, near-infrared, and upconverted measurements.

Quantaurus-QY Plus UV-NIR absolute PL quantum yield spectrometer: C13534-11

    • Standard type

    Absolute quantum yield spectrometer with detection range from 300 nm to 950 nm and detection resolution less than 2 nm (standard type).

    Quantaurus-QY Plus UV-NIR absolute PL quantum yield spectrometer: C13534-12

      • NIR type

      Absolute quantum yield spectrometer with detection range from 400 nm to 1100 nm and detection resolution less than 2.5 nm (NIR type ).

      Quantaurus-QY Absolute PL quantum yield spectrometer

      Abolute PL quantum yields measurement system Quantaurus-QY

      Compact one-box absolute quantum yield spectrometer for luminescence materials using photoluminescence method. Not only thin materials but also liquid solution and powder can be analyzed. It quickly measures the absolute PL quantum yield, excitation wavelength dependence and PL in a short time.

      Quantaurus-QY Absolute PL quantum yield spectrometer: C11347-11

        • Standard type

        Absolute quantum yield spectrometer with detection range from 300 nm to 950 nm and detection resolution less than 2 nm (standard type).

        Quantaurus-QY Absolute PL quantum yield spectrometer: C11347-12

          • NIR type

          Absolute quantum yield spectrometer with detection range from 400 nm to 1100 nm and detection resolution less than 2.5 nm (NIR type).

          Absolute PL quantum yield spectrometer

          Abolute PL quantum yields measurement system

          Absolute quantum yield spectrometer for luminescence material using photoluminescence method. Not only thin materials but also liquid solution and powder can be analyzed.

          Absolute PL quantum yield spectrometer: C9920-02

            Absolute quantum yield spectrometer with detection range from 300 nm to 950 nm and bandwidth less than 10 nm FWHM (manual control of excitation wavelength).

            Absolute PL quantum yield spectrometer: C9920-02G

              • Automatic control of excitation wavelength

              Absolute quantum yield spectrometer with detection range from 300 nm to 950 nm and bandwidth from 2 nm to 5 nm FWHM (automatic control of excitation wavelength).

              Absolute PL quantum yield spectrometer: C9920-03

                Absolute quantum yield spectrometer with detection range from 400 nm to 1100 nm and bandwidth less than 10 nm FWHM (manual control of excitation wavelength).

                Absolute PL quantum yield spectrometer: C9920-03G

                  • Automatic control of excitation wavelength

                  Absolute quantum yield spectrometer with detection range from 400 nm to 1100 nm and bandwidth from 2 nm to 5 nm FWHM (automatic control of excitation wavelength).

                  External quantum efficiency measurement systems

                  External quantum efficiency measurement system

                  High precision external quantum efficiency measurement system using an integrating sphere. It realizes high precision measurement independent from target luminescence angle characteristic.

                  External quantum efficiency measurement system: C9920-12

                    • Use of an integration sphere

                    External quantum efficiency (EQE) measurement system utilizing the method of counting photons from devices excited by electric current or voltage.

                    Light distribution measurement systems

                    Brightness light distribution characteristics measurement system

                    Brightness, emission spectrum and chromaticity of light emitting devices are measured in relation to the detection angle.

                    Light distribution measurement systems: C9920-11

                      • EL method

                      Brightness light distribution characteristics measurement system utilizing rotating stage.

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