ODPL measurement system

C15993-01

The ODPL measurement system uses an integrating sphere to measure the spectrum of omnidirectional photoluminescence and determine the emission efficiency of samples. This process is non-destructive and non-contact, and can instantly calculate IQE (internal quantum efficiency). IQE is necessary for quality evaluation of GaN single crystals, which have attracted attention as power device materials. It is also necessary for quality evaluation of perovskite crystals, which are expected to be useful for improving the efficiency of solar power generation and LEDs.

*ODPL: Omnidirectional photoluminescence

Specifications

Type number C15993-01
PL measurement wavelength range 300 nm to 950 nm
Multichannel spectroscope Photo-detector BT-CCD linear image sensor
Measurement wavelength range 200 nm to 950 nm
Wavelength resolution ≤ 2 nm
Number of photosensitive device channels 1024 ch
Device cooling temperature -15 ℃
AD resolution 16 bit
Spectroscope optical arrangement Czerny-Turner type
Integrating sphere Material Spectralon
Size 3.3 inch
Sample holder Size Substrate (6 mm × 6 mm × 1 mm to 17 mm × 17 mm × 1 mm)
A10095-01 or A10095-03 can be mounted.
Epi-illumination part Light sources for illunination White LED
Observation camera Color CMOS camera
Field of view size Approx.ϕ6 mm
Software Measurement / Analysis items EQE measurement
IQE calculation
Absorption ratio measurement
PL spectrum measurement
Dimensions / weight 725 mm (W) × 417 mm (H) × 380 mm (D) / Approx. 39.5 kg

*Excitation laser is not included in C15993. Please contact us for details.

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