The Optical NanoGauge Thickness measurement system C10178 is a non-contact film thickness measurement system utilizing spectral interferometry. Film thickness is measured quickly with high sensitivity and high accuracy through spectral interferometry. Our products use a multichannel spectrometer PMA as detectors, which allows for measurement of quantum yields, reflection, transmission/absorption, and a various other points while simultaneously measuring the thickness of various optical filters and coating films, and more.
The C10178-02 supports UV (200 nm to 950 nm).
|Measurement models (features)||supports UV|
|Measurable film thickness range (glass)||20 nm to 30 μm*1|
|Measurement reproducibility (glass)||0.02 nm*2 *3|
|Measurement accuracy (glass)||±0.4 %*3 *4|
|Light source||D2-Halogen light source|
|Measurement wavelength||200 nm to 950 nm|
|Spot size||Approx. φ1 mm*3|
|Working distance||10 mm*3|
|Number of measurable layers||Max. 10 layers|
|Analysis||FFT analysis, Fitting analysis, Optical constant analysis|
|Measurement time||19 ms/point*5|
|Fiber connector shape||φ12 sleeve shape|
|External control function||RS-232C, PIPE, Ethernet|
|Power supply||AC100 V to AC240 V, 50 Hz/60 Hz|
|Power consumption||Approx. 210 VA|
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