AnnualReport2015
11/36

Product developmentInfrared light detection elements that operate at room temperatureBecause the absorption wavelengths of gases assumed to cause environmental damage are within the 3-5 µm wavelength band of infrared light, it is possible to make measurements of gas concentrations by using infrared light detection elements that are sensitive to this wavelength band.The mainstream room temperature infrared light detection elements in this wavelength band, however, were themselves an environmental problem because they contain lead. Moreover, because models that did not contain lead required cooling, miniaturization and price reductions were limited, and applications were restricted as well. Given these considerations, the Company used its compound semiconductor crystal growth technology and processing technology, cultivated over many years, to develop environmentally friendly infrared light detection elements without lead that can be operated at room temperature in this wavelength band(*2). Measurement using these infrared light detection elements is expected to contribute not only to the environmental eld, but also to a broad range of sectors in the future, including medical care and agriculture.(*2)Part of this development result is based on the NEDO grant program “Development of High-Performance Quantum-type Infrared Detectors Operable at Room Temperature for Environmental Measurement/Manufacturing Use”.Small lm thickness measurement systems that can be easily incorporated into manufacturing and inspection equipmentRecently multilayer coatings have been applied to touch panels in products such as smartphones to give them functions such as electro-conductivity and surface protection. Film thickness meters, which are devices for inspecting for product defects by measuring the lm thickness, make it possible to accelerate measurement by incorporating such devices into manufacturing and inspection equipment. By utilizing state-of-the-art spectral interferometry to achieve greater miniaturization, together with functions that can simultaneously measure lm thickness of both surfaces of a substrate and support PLC(*3) connections, the Company has developed a lm thickness measurement system that is unique in the industry and can be easily incorporated into other equipment. The Company’s lm thickness measurement systems will help shorten operating times of manufacturing and inspection processes, and contribute to highly effective, stable quality control.(*3)Devices that use programs to automatically control equipment in plants or other locations.Room temperature operation IR detectorsFilm thickness on both sides of a base material can be measured at once by analyzing the spectra of white light that reects or transmits to varying degrees due to each layer’s refractive index.Combined waveFilm coating (front)White lightBase materialFilm coating (back)9Annual Report 2015

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