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Non-destructive testing using X-rays
What Is X-ray radiation?
X-rays are electromagnetic waves with wavelengths ranging from 1 pm to 10 nm. Compared to visible light and ultraviolet radiation, X-rays have much shorter wavelengths and higher energy, enabling them to penetrate a wide range of materials.
X-rays are generally categorized into:
- Hard X-rays: shorter wavelengths with higher penetration capability
Soft X-rays: longer wavelengths with lower energy
Principle of X-ray inspection
In non-destructive inspection using X-rays, radiation emitted from an X-ray source—a vacuum tube—passes through the object under inspection and is detected by an X-ray detector. As X-rays pass through the object, they are attenuated depending on the material’s thickness and composition. This attenuation creates contrast in the resulting image, which appears as variations in grayscale corresponding to differences in X-ray transmission.
The clarity and quality of X-ray images are influenced by both the intensity and the wavelength (energy) of the generated X-rays.
Increasing the tube current (A) of an X-ray source increases the amount of generated X-rays, thereby making the X-ray image brighter. Increasing the tube voltage (V) shortens the wavelength of the X-rays, enabling easier penetration of materials. Since the tube voltage required for sufficient penetration varies depending on the material, it is necessary to set appropriate voltage and current conditions according to the sample. In addition, by reducing the X-ray focal spot size to the micrometer range, it is possible to obtain high-resolution X-ray images with minimal blurring, even at high geometric magnification.
Tube Voltage (V)
Increasing the tube voltage shortens the X-ray wavelength and raises its energy, improving material penetration.
- Higher tube voltage → Greater penetration capability
Optimal voltage depends on the material being inspected
Proper voltage selection is essential for achieving high-contrast images
Tube Current (A)
Increasing the tube current raises the X-ray output, resulting in brighter images.
Higher tube current → Increased X-ray intensity → Brighter image
For the same object:
Higher output enables shorter imaging times
Supports higher conveyor speeds in inline inspection systems
Focal Spot Size
The focal spot size directly affects image resolution.
Larger focal spot:
- Increased penumbra (edge blur), especially at high geometric magnification
Smaller focal spot:
- Reduced blur
- Enables high-resolution, sharp X-ray imaging
By achieving a focal spot size in the micrometer range, it becomes possible to obtain highly detailed images even at high magnification.
Radiation Angle
A wider radiation angle:
Reduces the required irradiation distance
Allows inspection of larger objects
Enables imaging from oblique angles for three-dimensional structure observation
Selecting the optimal radiation angle based on the application and target object is essential for achieving the best inspection results.
X-ray non-destructive inspection methods and applications
Non-destructive testing methods using X-rays can be broadly divided into two main approaches in production lines: inline inspection and offline inspection.
Here, we introduce the characteristics, applications, and examples of each type of inspection.
Inline X-ray inspection
Inline inspection is a method in which the inspection process is integrated into the production line, and is suitable for 100% inspection of products with high production volumes. By automating the inspection process, cost reduction can be achieved. In addition, since abnormalities can be detected during the production process, it offers the advantage of high productivity. On the other hand, introducing and automating inline inspection requires time and cost for equipment design and system integration.
Inspection examples
ECU（Engine Control Unit）
Cracks and voids (bubbles) can be observed.
Circuit board for smartphone
Internal structure of a multilayer ceramic capacitor (0402 size) can be observed.
Cylindrical LiB for automotive
Gap inspection between the positive and negative electrodes
Baby food
Metal foreign matter overlapping onto the metal lid can be detected.
Recommended products
Toward Inline X-ray CT Inspection
In X-ray inspection, there is a growing demand for the inspection of complex structures and the detection of minute defects, and as a result, 3D imaging in offline inspection and sampling inspection has increasingly been required. In the future, it is expected that 3D imaging will also be required for 100% inspection in inline systems. X-ray CT inspection is a method in which X-rays are irradiated onto the object from multiple directions, and reconstruction processing is performed by a computer, enabling three-dimensional observation of the internal structure of the object under inspection.
Hamamatsu Photonics is one of the few companies in the world that develops and manufactures both microfocus X-ray sources, which are essential for acquiring high-resolution X-ray CT images, and high-speed X-ray detectors, such as flat panel sensors and photodiode arrays. We also offer solutions for the anticipated demand for inline CT inspection.
Configuration example
Imaging example
Offline X-ray Inspection (2D / 3D CT)
Offline inspection is a method in which the inspection process is conducted separately from the production line, and is suitable for structural analysis of products with complex shapes and high-value products. Compared to inline inspection, it enables more precise inspection and analysis, as well as sampling inspection from the production line. On the other hand, it often requires manual work such as transportation from the production line, which results in increased time and labor, making it unsuitable for 100% inspection.
Offline X-ray CT inspection is a method in which X-rays are irradiated onto the object under inspection from various directions, and reconstruction processing is performed by a computer, thereby enabling the internal structure of the object under inspection to be confirmed in three dimensions. Because three-dimensional images can be obtained, more accurate inspection and analysis become possible. By acquiring cross-sectional images continuously and tracking changes in abnormal locations, this method is effective when identifying disconnection locations, component cracks, and abnormal layers within multilayer substrates in semiconductors, electronic components, power modules, and similar applications. In addition, not only for substances composed of different materials, but also for those composed of the same material, differences can be measured based on variations in density. Therefore, this method is also utilized for the evaluation of new materials, small cast products, and precision composite components.
Inspection examples
GPU（Graphics Processing Unit）
Internal defect observation and dimensional measurement are possible.
Data courtesy of U.H.SYSTEM CORPORATION
Aluminum die-cast
Detailed information of the cavities inside the casting can be obtained.
Data courtesy of Toshiba Unified Technologies Corporation
Cylindrical LiB
High-definition structural analysis is possible by CT technology.
Data courtesy of Thermo Fisher Scientific Inc.
CFRP（Carbon Fiber Reinforced Plastics）
The orientation of fibers can be determined, and material porosity can be obtained.
Data courtesy of Thermo Fisher Scientific Inc.
Recommended products
We will introduce an optimal product lineup, themed around Automotive Electronics, Food, Structural Analysis, Infrastructure, and Security, along with practical application examples.
Other inspection methods
Demo Information
Hamamatsu Photonics proposes optimal solutions for X-ray non-destructive inspection through demonstration.
We provide trial photography using various X-ray sources, sensors, and cameras as a preliminary evaluation for X-ray non-destructive inspection requests from our customers.
Based on our experience accumulated over many years in the X-ray business, we not only introduce the most suitable devices, but also propose the best solutions, including useful tips and advice. Please feel free to contact us.
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