Fast decay phosphor

J13550-09D

For electron beam detection, high speed and long life phosphor.
High speed decay time : 3.5 ns

Features

High Speed Decay (Decay Time: 3.5 ns)

Long Life

High Brightness Efficiency

Applications

Semiconductor Inspection Instrument

SEM (Scanning Electron Microscopy)

Mass Spectrometry

This is used in combination with a conversion dynode or MCP when detecting ions.


General Electron Detection

Specifications

Characteristics

Dimensional outlines (Unit mm)

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