InGaAs line scan camera C15333-10E04

SWIR (short wavelength infrared) imaging is a great solution for non-destructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality.

Example applications include checking liquid volumes in packages, inspecting contents of sealed containers, and detecting damages and contaminants in agricultural products. In addition, applications in the semiconductor industry include Si wafer pattern inspection and solar cell defect detection.Integrating SWIR imaging into production lines requires cameras such as the C15333-10E04 InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line non-destructive inspection.

Compare to the conventional model, the C15333-10E04 has improved usability by adding an edge trigger function, which can shoot with a certain exposure time even the conveyor belt speed is changed while shooting. It also becomes compatible with a trigger enable function, which shoots only when an object is passing in front of the camera.

Catalog 1.1 MB/PDF

Features
Applications
Software
Specifications
Spectral response
Dimensions

Features

SWIR sensitivity from 950 nm to 1700 nm
1024 pixel linear array
Maximum line rate: 40 kHz
Interface: Employs Gigabit Ethernet
Equipped with high quality images (Background subtraction, Real time shading correction)

Applications

Food and agricultural products (damage inspection, quality screening, material discrimination, etc.)
Semiconductors (Si wafer pattern inspection, solar cell inspection by EL/PL, etc.)
Industry (moisture content, leak detection, container inspection, etc.)

Software

Our software provides the interface to access all of our carefully engineered camera features, from simply setting exposure to orchestrating complex triggering for multidimensional experiments.

Specifications

Type number	C15333-10E04
Imaging device	InGaAs line sensor
Effective no. of pixels	1024 (H) × 1 (V)
Cell size	12.5 μm (H) × 12.5 μm (V)
Effective area	12.8 mm (H) × 0.0125 mm (V)
Readout speed	Internal mode: 40 kHz (21 μs exposure time) Edge trigger: 20 kHz (21 μs exposure time) Sync readout: 40 kHz
Exposure time	21 μs to 1 s (1 μs step)
External trigger input	Edge trigger, Sync readout
External trigger signal routing	SMA or 12 pin HIROSE connector
Image processing functions	Background subtraction, Real time shading correction
Interface	Gigabit Ethernet
A/D converter	14 bit
Lens mount	C mount
Power supply	DC 12 V
Power consumption	6 W max.
Ambient operating temperature	0 ℃ to +40 ℃
Ambient storage temperature	-10 ℃ to +50 ℃
Ambient operating humidity	30 % to 80 % (with no condensation)
Ambient storage humidity	90 % max. (with no condensation)