Thickness measurement system

Thickness measurement system

The Gauge series delivers non-contact, high-precision thickness measurement: HyperGauge for in-plane wafer films, Optical NanoGauge for nanometer-scale layers, and Optical MicroGauge for micrometer-scale layers.

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Measurement film thickness range (glass): When converted with the refractive index of glass=1.5
Measurement film thickness range (silicon): When converted with the refractive index of silicon=3.67
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SEMICONDUCTOR APPLICATION LAB.

SEMICONDUCTOR APPLICATION LAB. (located in Joko Factory, Hamamatsu City, Shizuoka Prefecture) is a laboratory designed for co-creation with customers. We have equipment to solve your problems, including semiconductor failure analysis and wafer testing. 

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