We offer over 200 standard linear and area image sensors covering the short wavelength infrared (SWIR), near infrared (NIR), visible (VIS), ultraviolet (UV), and X-ray regions. With a broad selection from high speed, high sensitivity to wide dynamic range, our image sensors are suitable for different applications including spectroscopy analysis using spectrometers, industrial imaging such as machine vision cameras, microscopy, and distance measurements. We also provide supporting electronics such as easy-to-use driver circuits for sensor evaluation and driver modules for OEMs. Customizations are available for specific applications and requirements.
CCD/CMOS/NMOS image sensors for UV-VIS-NIR used for semiconductors, analytical instrumentation, spectroscopy applications and color measurement.
Hamamatsu provides InGaAs image sensor options covering the visible (VIS), near infrared (NIR), and short wavelength infrared (SWIR) regions, and they have a built-in CMOS IC, allowing easy operation.
X-ray flat panel sensors that combine a large-area CMOS image sensor and a fiber optic plate with scintillator (FOS). Can acquire high-definition, megapixel-level digital video and still images without distortion. Easy to install into other equipment.
Image sensors designed to measure distance to an object by the time-of-flight (TOF) method.
Silicon photodiode arrays combined with signal processing integrated circuits (IC). 64-256 ch arrays with or without scintillators. Driver circuits available for easy implementation.
Driver circuits and multi-channel detector heads to use with the associated data acquisition software for plug-and-play sensor characterization.
IIs produce high-contrast images under dark conditions. Suitable for night-time surveillance, as well as for scientific and technical research.
High-speed gated II units use gate operation to capture instantaneous images of high-speed phenomena occurring within extremely short time durations. Gate operation is basically the same function as a camera shutter, but performed electronically in a minimum gate time of 1/300,000,000th of a second. Background and excitation light outside the measurement time can be eliminated by synchronizing the gate operation with a laser pulse or other signal.
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