Features | External quantum efficiency measurement system

  • Use of an integrating sphere enables to measure EQE independent of the emission angle characteristic of a sample.
  • Software controls the constant current power supply.
  • The spectrum for each step of the applied voltage/current is measured instantaneously (I-V-L measurement).
  • Cooled BT-CCD enables high sensitive measurement.
  • Easy to handle intuitive software for measuring, calculating and controlling the system.
  • Display of combination of several variables (current, voltage, luminous efficiency, chromaticity, etc).
  • The system can be easily extended to absolute PL quantum yield measurement system and light distribution measurement system.

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