Luminescence efficiency measurement system Luminescence efficiency measurement system

Luminescence efficiency measurement system

Evaluation systems for fluorescence/luminescence material and device parameters.

The ODPL measurement system uses an integrating sphere to measure the spectrum of omnidirectional photoluminescence and determine the emission efficiency of samples.

Compact one-box absolute quantum yield spectrometer for luminescence materials using photoluminescence method. Not only thin materials but also liquid solution and powder can be analyzed. It quickly measures the absolute PL quantum yield, excitation wavelength dependence and PL in a short time.

Compact one-box absolute quantum yield spectrometer for luminescence materials using photoluminescence method. Additional options allow high-sensitivity, near-infrared, and upconverted measurements.

Absolute quantum yield spectrometer for luminescence material using photoluminescence method. Not only thin materials but also liquid solution and powder can be analyzed.

High precision external quantum efficiency measurement system using an integrating sphere. It realizes high precision measurement independent from target luminescence angle characteristic.

Brightness, emission spectrum and chromaticity of light emitting devices are measured in relation to the detection angle.

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