CCD area image sensor


Enhanced near infrared sensitivity, Constant element temperature control


The S16011 series is a family of back-thinned FFT (full frame transfer)-CCD image sensors for photometric applications that offer improved sensitivity in the near infrared region at wavelengths longer than 800 nm. In addition to having high infrared sensitivity, the S16011 series can be used as an image sensor with a long photosensitive area in the direction of the sensor height by binning operation, making it suitable for detectors in Raman spectroscopy. Binning operation also ensures even higher S/N and signal processing speed compared to methods that use an external circuit to add signals digitally. In addition, a TE-cooler is built into the package to keep the element temperature constant (approx. 5 °C) during operation. The S16011 series has a pixel size of 14 × 14 μm and is available in two image areas of 14.336 (H) × 0.896 (V) mm (1024 × 64 pixels) and 28.672 (H) × 0.896 (V) mm (2048 × 64 pixels). The S16011 series is pin compatible with the S11850-1106, and so operates under the same drive conditions.

- NIR high sensitivity: QE=36% (λ=1000 nm)
- One-stage TE-cooled type
 (element temperature: approx. 5 °C)
- High CCD node sensitivity: 6.5 μV/e-
- High full well capacity and wide dynamic range
 (with anti-blooming function)
- Pixel size: 14 × 14 μm
- MPP operation


Type IR-enhanced type
Image size 28.672 x 0.896 mm
Number of effective pixels 2048 x 64 pixels
Pixel size 14 x 14 μm
Spectral response range 200 to 1100 nm
Line rate (typ.) 106 lines/s
Line rate (max.) 200 lines/s
Dark current (typ.) 50 e-/pixel/s
Readout noise (typ.) 6 e- rms
Cooling One-stage TE-cooled
Package Ceramic
Dedicated driver circuit C11860
Measurement condition Typ. Ta=25 ℃, unless otherwise noted

Spectral response

Dimensional outline (unit: mm)

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