Fourier Transform Infrared Spectrometer (FTIR)

Theory, practice, and applications

Slawomir Piatek, Ph.D., Hamamatsu Corporation and New Jersey Institute of Technology
John Gilmore, Hamamatsu Corporation
February 10, 2021

This webinar with John D. Gilmore and Slawomir Piatek, Ph.D., will review the basic theory behind a Michaelson-Morley interferometer, and will apply it directly to today’s modern MEMS-based FTIR engines. The presenters will compare traditional grating-based spectrometers with FTIR, and the associated technological limitations, such spectral coverage, signal to noise ratio and noise induced by mechanical vibration. Participants will witness a live MEMS FTIR product demonstration and will learn about FTIR applications and some market challenges and solutions.

Learning goals:
  • Learn the basic theory behind Michelson-Morley interferometer.
  • Become familiar with the basic setup of FTIR spectrometer.
  • Understand performance trade-offs associated with the limitations of the hardware, such as mirror movement, sensitivity, detector noise, and signal-to-noise ratio.
  • Learn how to compare traditional grating-based NIR spectrometers with new MEMS FTIR spectrometers.
  • Become familiar with data analysis and portrayal.
  • Become familiar with the most common applications of FTIR spectroscopy.

About the presenter

Slawomir S. Piatek has been measuring proper motions of nearby galaxies using images obtained with the Hubble Space Telescope as a senior university lecturer of physics at New Jersey Institute of Technology. He has developed a photonics training program for engineers at Hamamatsu Corporation in New Jersey in the role of a science consultant. Also at Hamamatsu, he is involved in popularizing a SiPM as a novel photodetector by writing and lecturing about it, and by experimenting with the device. He earned a Ph.D. in Physics at Rutgers, the State University of New Jersey, in 1994.


John D. Gilmore has been characterizing leading-edge photonic devices for over three decades. He has developed sophisticated test and measurement capabilities, enabling precise characterization of image sensors and spectrometers. In addition, he has vast knowledge of the operation, optimization, and practical use of photonic devices, with particular emphasis on image sensors, spectrometers, and Raman modules. He received his B.S. degree in electronic engineering technology (EET) from Capital Institute of Technology, Laurel, Md., in 1986, and received his M.S. degree in electrical engineering with a concentration in solid state devices and material processing from the New Jersey Institute, Newark, N.J., in 1993. He joined Hamamatsu Corp. in September of 1986 and is presently the spectrometer business development manager. He is currently involved with the development of application-specific inspection equipment, general spectrometer marketing, and advanced field technical support.


Laurin Publishing Company, LLC, are producers and owners of the recording.