Raman spectroscopy - theory, practice and application

Slawomir Piatek, Ph.D., Hamamatsu Corporation and New Jersey Institute of Technology
John Gilmore, Hamamatsu Corporation
May 6, 2020

About this webinar

This webinar reviews the basic theory behind normal, resonant, and surface-enhanced Raman scattering; discusses the required hardware in a working Raman spectrometer; describes data analysis and presentation; and gives examples of common applications. In addition, it will examine some of the market challenges and solutions.

  • Review of the basic principles governing the operation of a SiPM, together with a description of its opto-electronic characteristics.
  • Learn the basic theory behind normal, resonant, and surface-enhanced Raman scattering.
  • Become familiar with the basic setup of a Raman spectrometer.
  • Understand performance trade-offs associated with the limitations of the hardware such as illumination laser, diffraction grating, and image sensor.
  • Learn about factors that influence the choice of the illumination laser.
  • Become familiar with data analysis and portrayal.
  • Become familiar with the most common applications of Raman spectroscopy.

About the presenter

Slawomir S. Piatek has been measuring proper motions of nearby galaxies using images obtained with the Hubble Space Telescope as a senior university lecturer of physics at New Jersey Institute of Technology. He has developed a photonics training program for engineers at Hamamatsu Corporation in New Jersey in the role of a science consultant. Also at Hamamatsu, he is involved in popularizing a SiPM as a novel photodetector by writing and lecturing about it, and by experimenting with the device. He earned a Ph.D. in Physics at Rutgers, the State University of New Jersey, in 1994.

 

John D. Gilmore has been characterizing leading-edge photonic devices for over three decades. He has developed sophisticated test and measurement capabilities, enabling precise characterization of image sensors and spectrometers. In addition, he has vast knowledge of the operation, optimization, and practical use of photonic devices, with particular emphasis on image sensors, spectrometers, and Raman modules. He received his B.S. degree in electronic engineering technology (EET) from Capital Institute of Technology, Laurel, Md., in 1986, and received his M.S. degree in electrical engineering with a concentration in solid state devices and material processing from the New Jersey Institute, Newark, N.J., in 1993. He joined Hamamatsu Corp. in September of 1986 and is presently the spectrometer business development manager. He is currently involved with the development of application-specific inspection equipment, general spectrometer marketing, and advanced field technical support.