Webinar: A Technology-Based Total Solution for X-Ray NDT Webinar: A Technology-Based Total Solution for X-Ray NDT

Webinar: A Technology-Based Total Solution for X-Ray NDT

Event details

Webinar: A Technology-Based Total Solution for X-Ray NDT: From Source to Sensor, High Resolution and AI Denoising
Date: Wednesday, September 9, 2026
Time: 17:00 CEST
Channel: Register via Optics.org
Speaker: Sara Ziliani, Sales Engineer, Hamamatsu Photonics Italia

What to expect

Modern X-ray inspection requires balancing resolution, speed, image quality, and system performance. In this webinar, Hamamatsu Photonics presents a complete technology-based approach to X-ray NDT, from microfocus X-ray sources and high-resolution detectors to TDI line-scan technology, scalable detector architectures, and AI denoising.

 

What you will learn

Attendees will learn how optimizing the entire imaging chain can improve inspection performance in industrial applications, with practical examples from PCB inspection, Li-ion battery analysis, material analysis, food inspection, and security screening.

Who should attend

  • Industrial general NDT
  • Industrial CT
  • Electronics Inspection
  • Battery Inspection
  • Food Inspection
  • Security Inspection 

Presenter Bio

Sara Ziliani, PhD, has been with Hamamatsu Photonics Italia since 2022 and is responsible for industrial X-ray NDT, agri-sorting with infrared technologies, and radiation monitoring markets. Prior to joining Hamamatsu, she completed a PhD in Nuclear Physics, with a project focused on gamma-ray spectroscopy and radiation detectors.

Sara Ziliani (HPI)

Sara Ziliani

Sales Engineer

Hamamatsu Photonics Italia

Reserve your seat

Reserve your place to learn practical strategies for achieving higher-quality X-ray inspection results without compromising speed or resolution.