Compact SWIR spectroscopy modules improve signal quality for accessible material analysis

2026/05/19
  • Hamamatsu Photonics Europe

Upgraded MEMS FPI design delivers higher signal to noise ratio and improved stray light suppression


Hamamatsu Photonics announces an upgraded version of its MEMS FPI spectroscopic modules. Designed for short wave infrared (SWIR) analysis, the C17752, C17753 and C17754 compact sensors offer improved signal to noise performance and enhanced stray light rejection, supporting more reliable material analysis in cost sensitive and space constrained applications.

Key Benefits

The updated MEMS‑FPI modules introduce design enhancements that improve measurement stability and spectral clarity. These spectroscopic modules are engineered to support efficient SWIR analysis while keeping integration complexity and cost low.

  • Improved signal to noise performance supports stable and repeatable spectral measurements
  • Enhanced stray light suppression contributes to clearer spectral data
  • Compact, integrated design enables use in space constrained and embedded
  • Optional fiber adapter with integrated lens supports transmission measurements and flexible system design
  • USB plug and play operation allows quick setup without complex optical alignment
  • Cost efficient solution for accessible SWIR spectroscopy

For detailed MEMS-FPI sensor performance and spectral specifications, download the PDF below.

Target Applications

The upgraded MEMS‑FPI module supports a range of industrial and analytical applications, including:

  • Material sorting
  • Quality control and inspection
  • Process monitoring
  • Embedded and portable spectroscopy systems
  • Laboratory and industrial R&D

For full technical details, visit the C17752, C17753 and C17754 product pages on the Hamamatsu Photonics website.

 

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