Failure analysis system Failure analysis system

Sequencer software | Failure analysis system

The SEMICONDUCTOR APPLICATION LAB. is a collaborative space designed to foster co-creation with our customers. It offers hands-on demonstrations with actual equipment, including on-site demos with our expert engineers and sample testing prior to purchase.​

Sequencer software

Making wafer-level failure trends visible

Sequencer software enables automated failure analysis at the wafer level. While die-to-die comparison is limited in manual EFA, automatic die-to-die analysis using our Sequencer software makes wafer-level failure trends visible.

Improved throughput

Data collection is often time-consuming, requiring several hours to image even a small number of sites. Equipped with Sequencer software, our automated system features a macro-lens-only workflow that processes up to 720 sites within 24 hours—delivering throughput equivalent to nine conventional systems.

Automatic die-to-die analysis

1. Automatically run die-to-die analysis using a macro lens.

2. Anomaly extraction with automatic zoom-in for deeper analysis.

Related products

The Dual PHEMOS-X is designed for advanced, 3D, nontransparent devices where simultaneous optical FA may be required from both sides (top and bottom) at the wafer or die level.

iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

SEMICONDUCTOR APPLICATION LAB.

SEMICONDUCTOR APPLICATION LAB. (located in Joko Factory, Hamamatsu City, Shizuoka Prefecture) is a laboratory designed for co-creation with customers. We have equipment to solve your problems, including semiconductor failure analysis and wafer testing. 

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