Failure analysis system Failure analysis system

TD Imaging | Failure analysis system

The SEMICONDUCTOR APPLICATION LAB. is a collaborative space designed to foster co-creation with our customers. It offers hands-on demonstrations with actual equipment, including on-site demos with our expert engineers and sample testing prior to purchase.​

About TD Imaging

TD Imaging is a new technology suitable for identifying defects in semiconductors with complex structures, such as logic semiconductors. It can pinpoint defects through internal metal layers.

Features

Patented Laser Scan Technology

Improves signal-to-noise ratio (S/N) by 38 times. Hamamatsu owns the patent for laser-based ThermoReflectance, delivering superior precision and reliability in thermal imaging-and continues to lead innovation in this field.

Optimal Wavelength Selection

670 nm light source, compared to 1300 nm, enhances S/N by 4 times on metals like Cu and Al.

Higher Sensitivity

Flexible scan speed, size, and integrations, with data acquisition in 90 seconds, providing higher S/N than LIT.

Image of TD Imaging features

Comparison of TD Imaging and LIT

Comparison of TD Imaging and LIT

Proposed combined workflow

After detecting a wide range of signals using LIT technology, the PFA hit rate is improved by narrowing down the signals to 2 μm using TD Imaging(ThermoDynamic Imaging) while leveraging image processing. This makes defect identification more accurate and enhances the efficiency of analysis.

Proposed combined workflow

Related products

The Dual PHEMOS-X is designed for advanced, 3D, nontransparent devices where simultaneous optical FA may be required from both sides (top and bottom) at the wafer or die level.

iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

PHEMOS-X is a high-resolution emission microscope that captures light emission and heat generation caused by semiconductor device failures and identifies the failure location. It can be used for a wide range of applications from power devices to advanced device analysis.

SEMICONDUCTOR APPLICATION LAB.

SEMICONDUCTOR APPLICATION LAB. (located in Joko Factory, Hamamatsu City, Shizuoka Prefecture) is a laboratory designed for co-creation with customers. We have equipment to solve your problems, including semiconductor failure analysis and wafer testing. 

*It may not work properly depending on your browser and settings.

Contact us for more information.

  • Literature
  • Price
  • Delivery
  • Custom order
  • Demo
  • Support
  • Other

Contact us