Fundamentals of Inline High-Resolution X-ray Inspection

Simon Whitbread, X-Ray Technology Specialist, Hamamatsu Photonics

About this webinar

In this recorded webinar, we explore the active component parts of an in-line X-ray inspection system, with a particular focus on how to optimize their performance for superior image quality. We share our unique expertise as a supplier of both X-ray detectors and high-resolution Microfocus X-ray sources, two essential elements for achieving the highest quality imaging. The session also covers recent advances in imaging modalities, including how Computed Tomography (CT) is evolving from traditional offline inspection methods to “At-line” and “In-line” applications — a key shift for inspecting increasingly complex products in finer detail.

Ideal for: Engineers, researchers, and quality professionals interested in the latest developments and innovations in X-ray imaging technology.

About the presenter

Simon Whitbread has worked for over two decades at Hamamatsu Photonics, where he currently advises UK Industry, in his capacity as an X-ray Technology Specialist. Having worked across all markets needing X-Ray Imaging from Industrial, Security to Medical & Academic Research, Simon has driven UK business development and managed the full sales pipeline for Hamamatsu Photonics. With a strong physics background, Simon can draw upon his many years of experience to educate and explain the principles of X-ray imaging to a wide audience. 

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Simon Whitbread, X-Ray Technology Specialist

Simon Whitbread, X-Ray Technology Specialist

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